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Au-SiO2 Samples

Multilayer samples for subsurface s-SNOM imaging.

Articles

B. Kusnetz., J. Belhassen, D. E. Tranca, S. G. Stanciu, S.-R. Anton, Z. Zalevsky, G. A. Stanciu, A. Karsenty, “Generic Arrays of Surface-positioned and Shallow-buried Gold Multi-shapes as Reference Samples to benchmark near-field microscopes. Part 1: Applications in s-SNOM depth imaging”, Results in Physics 56 (2024) 107318. doi: https://doi.org/10.1016/j.rinp.2023.107318

Jerusalem College of Technology

21 Havaad Haleumi St

Jerusalem 9116001, Israel

Tel: +972-2-6751140

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