AFM and NSOM techniques have progressed in parallel in recent decades, with each one providing advantages. Moreover, significant progress was recently observed in the manufacture of new tips using processing methods, as well as in the simulation of new tip designs for future manufacture. Case studies combining organic light-emitting devices (OLEDs) with micromachined silicon cantilevers, as well as organic photodetectors, were also investigated.

 

The idea of combining the two measurement capabilities, AFM and NSOM, into one dual mode based on silicon tips is quite unique and presents several advantages. The main important advantages that the proposed concept offers include the following features: having dual modes in one tip, use of standard commercial starting materials, multifunctionality, energetic efficiency, light acquisition at the surface of the sample, and good signal-to-noise ratio (SNR). The AFM–NSOM dual-mode improved system is presented in the below photographs.