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Electrical Characterization Lab

I-V / C-V Probe Station

Dark Box Probe Station, XYZ Manipulators, adjustable semi automatic stage, with Alessi LY1 Laser Cutting system , Agillent HP4155B Semiconductor Parametric Analyzer

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Lock-In-Amplifier (LIA)

A lock-in amplifier is a type of amplifier that can extract a signal with a known carrier wave from an extremely noisy environment. Depending on the dynamic reserve of the instrument, signals up to a million times smaller than noise components, potentially fairly close by in frequency, can still be reliably detected

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HP4155B Semiconductor Parametrical Analyzer

The Semiconductor Parameter Analyzer can be used to apply test signals (voltages or currents) to one or more nodes of a circuit, then measure the voltages and currents at other nodes in the circuit. It can sweep a test voltage across hundreds of values in a matter of seconds.

It offers 4 built-in source/measurement units (SMUs), 2 voltage source units (VSUs), and two voltage monitor units (VMUs).

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Alessi 4-points Probe Station

Parameters such as film thickness, sheet resistance, and bulk  resistivity can be evaluated using the Four-Point Probe.

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Digital Oscilloscopes

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Programmable DC current source

The Model 121 programmable DC current source is a precision instrument suitable for bench-top use or panel-mounted operation in labs, test facilities, and manufacturing environments. It provides a low-noise, highly stable source of current up to 100 mA, with convenient manual selection through 13 pre-set output levels, each representing a ten-fold change in power when attached to a resistive load. A “user” setting allows the current output to be defined anywhere within the operating range of the unit, from 100 nA to 100 mA

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