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AFM-NSOM Nanopolarimeter

Nanopolarimeter for use in AFM-NSOM imaging

ALEO is developing an enhanced scanning tip for AFM-NSOM which functions as a nanoscale polarimeter. The tip consists of a tungsten-silicon conical photodetector modified with four differently shaped subwavelength apertures, which enable the determination of incident light’s polarization state. The system is mounted on a standard AFM cantilever and can serve as a triple-mode scanning system, with complementary topography scanning, optical data analysis, and polarization state detection. The device was designed and simulated, and initial steps toward fabrication were taken using the application of advanced nanotechnology tools to a commercial AFM probe.

Articles

M. Karelits, Z. Zalevsky, A. Karsenty, “Nano Polarimetry: Enhanced AFM-NSOM Triple-Mode Polarimeter Tip”, Nature Scientific Reports 10, 16201 (2020). doi: https://doi.org/10.1038/s41598-020-72483-9


Y. Zigman, B. Kusnetz., J. Belhassen, A. Karsenty, “AFM-NSOM Nano-Polarimeter: Wide-ranging Sensing Device for Synchronized Scanning”, Optics & Lasers in Engineering 176 (2024) 108074. doi: https://doi.org/10.1016/j.optlaseng.2024.108074

Jerusalem College of Technology

21 Havaad Haleumi St

Jerusalem 9116001, Israel

Tel: +972-2-6751140

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