AFM-NSOM
AFN-NSOM photodetector tips
This subwavelength aperture, platinum–silicon truncated conical scanning tip/photodetector is designed for use in dual mode AFM-NSOM measurements. Collecting the reflected light directly from the scanned surface results in a more efficient process and increases the SNR. The fabrication process uses advanced nanotechnology tools to modify a commercial silicon cantilever. Preliminary results show that AFM resolution is not significantly affected and that there is an improvement in surface characterization.
Articles
M. Karelits, E. Lozitsky, A. Chelly, Z. Zalevsky and A. Karsenty, “Advanced Surface Probing using Dual-Mode NSOM-AFM Silicon-Based Photo-Sensor”, Nanomaterials 2019, 9(12), 1792, Special Issue “Nano Fabrications of Solid-State Sensors and Sensor Systems”. doi: https://doi.org/10.3390/nano9121792
A. Karsenty, A. Chelly, M. Sinvani, H. Pinhas, O. Wagner, Y. Danan, and Z. Zalevsky, “Label Free Super-Resolved Nanoscopy: PALM-Like, STED-Like and Hybrid AFM/NSOM”, 2019 21st International Conference on Transparent Optical Networks (ICTON), Angers, France, 9-13 July 2019, pp. 1-1. doi: 10.1109/ICTON.2019.8840248, https://ieeexplore.ieee.org/document/8840248
Z. Zalevsky, A. Karsenty, A. Chelly, “Photodetector for Scanning Probe Microscope”, Patent No. US 11,169,176 B2. Date of Patent: Nov. 9, 2021. Available online: https://patents.google.com/patent/US11169176B2/en?inventor=Avi+KARSENTY, https://patentimages.storage.googleapis.com/d2/f8/d7/41990657fa89dd/US11169176.pdf