Inspection and Characterization Tools

The lab is made of 4 sub-labs: 1) Design & Simulations, 2) Thin Films Characterization, 3) Electrical, 4) Optical.

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Combined Electro-Optics Probe Station

​​Data acquisition of I-V and C-V measurements. Vertical laser for illumination trigger and influence of the current.

Thin Films Characterization (TFC)​​​
AFM at ALEO - Atomic Force Microscope.jp
AFM - Atomic Force Microscope

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Advanced Microscopy Analysis

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Series of microscopes, with and without camera, software and adapted hardware.

Advanced Microscopy Analysis

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Series of microscopes, with and without camera, software and adapted hardware.

Nanospec
Microscope
Profilometer
FT-750